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 Test and dEpendability of microelectronic integrated SysTems

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Libraries Analytical models Software Security Simulation Delays Transistors Power consumption Integrated circuit testing Education COTS Atmospheric neutrons Heavy ions Through-silicon vias Fault simulation Approximate Computing Digital ATE Soft error Analog signals Scan Attacks Countermeasure Diagnosis Phase noise Machine-learning algorithms Microprocessors Alternate testing Power demand 1-bit acquisition Integrated circuit modeling Testing Microprocessor chips Monitoring Silicon Logic testing Fiabilité Reliability Laser Scan Encryption Neutrons 3D integration Fault Injection Automatic test pattern generation Logic gates Digital signal processing Cross section Noise measurement SRAM Memories Hardware Trojan Diffusion model Fault attacks ATPG Multiple cell upset MCU OQPSK Circuit faults Stream Cipher Test and Security FDSOI Computational modeling Hardware JTAG Fault tolerant systems Transient analysis Power supplies Hardware Security Radiation ZigBee Integrated circuits Switches Analog/RF integrated circuits Integrated circuit reliability Fault tolerance Particle detector SER Machine Learning Integrated circuit design Single event upset SEU Ensemble methods Random access memory Estimation Test One bit acquisition Flip-flops RF integrated circuits BIST Test cost reduction Transient faults Computer architecture Process variability Protons SEU Hardware security Combinational circuits Radiation hardening RF test Test efficiency Fault injection Clocks Indirect testing Soft errors Approximate computing