Characterization of two sources of tolerance/resistance to Barley yellow dwarf virus-PAV (BYDV-PAV) in wheat and estimation of their durability using serial passage experiment procedures - INRAE - Institut national de recherche pour l’agriculture, l’alimentation et l’environnement Accéder directement au contenu
Article Dans Une Revue Parasitica Année : 2005

Characterization of two sources of tolerance/resistance to Barley yellow dwarf virus-PAV (BYDV-PAV) in wheat and estimation of their durability using serial passage experiment procedures

Résumé

Serial passage experiments (SPEs) of a Barley yellow dwarf virus-PAV (BYDV-PAV) isolate were performed on the BYDV-resistant Zhong ZH and TC14 wheat lines to evaluate their potential resistance durability. At passages number 2, 3, 4, 5, 6, 44, 62 and 110, biological properties of the produced isolates were recorded by monitoring infection percentages and virus titres during the first three weeks of viral infection. Analyses performed using the percentage of infected plants and the area under concentration progress curves demonstrated that these two resistant lines induce, from the 5th passage, a selection of BYDV variant(s) with significantly modified infection abilities. Such results set to reconsider the possible use of Zhong ZH and TC14 lines in BYDV-resistant breeding programmes

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Dates et versions

hal-02673723 , version 1 (31-05-2020)

Identifiants

  • HAL Id : hal-02673723 , version 1
  • PRODINRA : 18516

Citer

Florian Chain, Gerard Riault, Maxime M. Trottet, Emmanuel Jacquot. Characterization of two sources of tolerance/resistance to Barley yellow dwarf virus-PAV (BYDV-PAV) in wheat and estimation of their durability using serial passage experiment procedures. Parasitica, 2005, 61 (1), pp.41-46. ⟨hal-02673723⟩
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