Skip to Main content Skip to Navigation
Journal articles

Advanced processing of EBSD data to distinguish the complex microstructure evolution of a Cu-Ni-Si alloy induced by fatigue

Abstract : The present work aims at identifying the evolution of the microstructure of a Cu-Ni-Si (Corson alloy) alloy after low cycle fatigue by means of advanced electron microscopy analysis techniques (SEM-ECCI, Orientation Imaging Microscopy by means of SEM-EBSD and TEM). Deep attention is paid on the material subjected to high cyclic strains where a transient cellular dislocation structure transformed into precipitate free bands. It is shown that the formation of dislocation cells leads to a high GROD and high GOSaera value and its standard deviation. However, the presence of precipitate free bands results in the low GOSarea level and its low standard deviation.
Complete list of metadata

https://hal.univ-lille.fr/hal-02279250
Contributor : Lilloa Université de Lille <>
Submitted on : Thursday, September 5, 2019 - 10:33:16 AM
Last modification on : Saturday, August 7, 2021 - 3:50:38 AM

Identifiers

Collections

Citation

Jeremie Bouquerel, Maxime Delbove, Jean Bernard Vogt. Advanced processing of EBSD data to distinguish the complex microstructure evolution of a Cu-Ni-Si alloy induced by fatigue. Materials Characterization, 2018, Materials Characterization, 145, pp.556-562. ⟨10.1016/j.matchar.2018.09.017⟩. ⟨hal-02279250⟩

Share

Metrics

Record views

108