Article Dans Une Revue Wood Science and Technology Année : 2006

Measuring moisture content profiles in a board during drying: a polychromatic X-ray system interfaced with a vacuum/pressure laboratory kiln

Résumé

A standard X-ray source and an energy-sensitive detector were placed on both sides of a wood dryer which operates over a wide range of drying conditions. The spectrometric X-ray intensities transmitted through the wood sample were related to the mass concentration of wood and water using a rigorous calculation needed in the case of a polychromatic X-ray beam. The source and the detector are carried by a motion controller in order to scan the sample at different drying times and determine the moisture content (MC) profile along the board thickness. Treatment on spectrometric data and the evolution of the MC profiles in a Norway spruce board (Picea abies) are presented in this work.

Dates et versions

hal-02665918 , version 1 (31-05-2020)

Identifiants

Citer

Ricardo Baettig, Romain Remond, Patrick Perré. Measuring moisture content profiles in a board during drying: a polychromatic X-ray system interfaced with a vacuum/pressure laboratory kiln. Wood Science and Technology, 2006, 40 (4), pp.261-274. ⟨10.1007/s00226-006-0068-7⟩. ⟨hal-02665918⟩
49 Consultations
0 Téléchargements

Altmetric

Partager

  • More