SIMS localization of nitrogen in the leaf of soybean: basis of quantitative procedures by localized measurements of isotopic ratios - INRAE - Institut national de recherche pour l’agriculture, l’alimentation et l’environnement
Article Dans Une Revue Journal of Trace and Microprobe Techniques Année : 1999

SIMS localization of nitrogen in the leaf of soybean: basis of quantitative procedures by localized measurements of isotopic ratios

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hal-02693653 , version 1 (01-06-2020)

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  • HAL Id : hal-02693653 , version 1
  • PRODINRA : 59017

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N. Grignon, J. Jeusset, E. Lebeau, C. Moro, Alain Gojon, et al.. SIMS localization of nitrogen in the leaf of soybean: basis of quantitative procedures by localized measurements of isotopic ratios. Journal of Trace and Microprobe Techniques, 1999, 17 (4), pp.477-490. ⟨hal-02693653⟩
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